If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...
A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of ...
about their test equipment and how they support RF and microwave chip designs. Maury Microwave’s on-wafer probe station incorporates the Nano5G automated impedance tuner that’s optimized for ...
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