Austin, Tex. — National Instruments has introduced its first PXI source measure unit (SMU) and two ultra-high-density PXI switch modules, extending its PXI platform for semiconductor validation test.
The 3U-high PXI-4130 programmable power SMU and the PXI-2535 and 2536 ultrahigh-density switching matrix modules add new capabilities to PXI systems, suiting them for such applications as IC ...