Asad Aziz, Project Manager, Computation and WiredCommunications Semiconductor Test Solutions, David E. MCFeely,Product Marketing Specialist, Interface Solutions, Agilent Automated Test Group Palo Alto ...
A new approach to jitter testing has been devised for leading-edge systems. It takes a spectral view of the jitter that not only allows immediate identification of the sources for debugging but also ...
January 29, 2013. National Instruments at DesignCon highlighted its new NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer, with 10 bits of vertical resolution ...
Volumes have been written about jitter, an indication of the complexity associated with timing uncertainty. Actually, timing errors are easy to measure. It is in the assignment of blame that the ...
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